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Takizuka, Tomonori; ITPA H-mode Threshold Database Working Group*
Plasma Physics and Controlled Fusion, 46(5A), p.A227 - A233, 2004/05
Times Cited Count:57 Percentile:84.55(Physics, Fluids & Plasmas)To evaluate the H-mode power threshold in future tokamak reactors, quantitative scaling formulas have been developed by using the ITPA threshold database. Recently data from spherical tokamaks (MAST and NSTX) were supplied to the ITPA database. A new scaling expression, which includes the absolute magnetic field B instead of the toroidal magnetic field, subsumes the plasma current dependence at low aspect ratio and is consistent with the previous data without any explicit current dependence. Other possible influence of the low aspect ratio to increase the power threshold is also investigated. It is cralified for the whole data set that the effective charge number Z raises the power threshold. By adding Z as a parameter of the scaling expression, both the scattering nature and the low-density anomaly found in the experimental data can be reduced.
Naito, Osamu; Hatae, Takaki
JAERI-Research 2002-033, 9 Pages, 2003/03
A simulation study on the feasibility of inferring spatial profile along with electron temperature and density in Thomson scattering diagnostic is presented. The background signal, which is usually discarded after subtracted from the Thomson scattered signal, is used in the reconstruction procedure. If the contribution from line radiation to the background signal is by one order of magnitude smaller than that from bremsstrahlung, a fairly accurate profile can be reconstructed.
Koide, Yoshihiko; Sakasai, Akira; Sakamoto, Yoshiteru; Kubo, Hirotaka; Sugie, Tatsuo
Review of Scientific Instruments, 72(1), p.119 - 127, 2001/01
Times Cited Count:39 Percentile:84.4(Instruments & Instrumentation)no abstracts in English
; Yokota, Yukihiko*; Watanabe, Hiroshi; Shikazono, Naoya; Tano, Shigemitsu*
GSI-95-10, 0, p.87 - 90, 1995/00
no abstracts in English
Spectrochimica Acta, Part A, 43(9), p.1147 - 1150, 1987/09
no abstracts in English
Journal of Chemical Physics, 84(3), p.1670 - 1676, 1986/00
Times Cited Count:2 Percentile:12.9(Chemistry, Physical)no abstracts in English
Journal of Chemical Physics, 82(2), p.860 - 867, 1985/00
Times Cited Count:2 Percentile:15.04(Chemistry, Physical)no abstracts in English
; Tasaka, Kanji; ; ; ;
Nuclear Technology, 70, p.189 - 203, 1985/00
Times Cited Count:2 Percentile:37.51(Nuclear Science & Technology)no abstracts in English
Journal of Chemical Physics, 80(4), p.1556 - 1561, 1984/00
Times Cited Count:6 Percentile:29.02(Chemistry, Physical)no abstracts in English
Spectrochimica Acta, Part A, 39(2), p.181 - 187, 1983/00
no abstracts in English
Journal of Chemical Physics, 76(5), p.2565 - 2568, 1982/00
Times Cited Count:11 Percentile:45.24(Chemistry, Physical)no abstracts in English
Journal of Chemical Physics, 77(1), p.424 - 429, 1982/00
Times Cited Count:6 Percentile:30.21(Chemistry, Physical)no abstracts in English
Journal of Chemical Physics, 77(10), p.5040 - 5044, 1982/00
Times Cited Count:10 Percentile:42.82(Chemistry, Physical)no abstracts in English
Journal of Chemical Physics, 74(8), p.4738 - 4739, 1981/00
Times Cited Count:2 Percentile:38.66(Chemistry, Physical)no abstracts in English
Spectrochimica Acta, Part A, 37A(10), p.873 - 878, 1981/00
no abstracts in English
Journal of Chemical Physics, 72(1), p.1 - 6, 1980/00
Times Cited Count:41 Percentile:79.96(Chemistry, Physical)no abstracts in English
Journal of Chemical Physics, 72(6), p.3663 - 3668, 1980/00
Times Cited Count:40 Percentile:79.47(Chemistry, Physical)no abstracts in English
Journal of Chemical Physics, 73(11), p.5459 - 5463, 1980/00
Times Cited Count:34 Percentile:75.8(Chemistry, Physical)no abstracts in English
Chemical Physics Letters, 66(1), p.149 - 153, 1979/00
Times Cited Count:1no abstracts in English